Author:
Autran J.L.,Munteanu D.,Roche P.,Gasiot G.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference76 articles.
1. SER – history, trends and challenges;Ziegler,2004
2. Effects of atmospheric neutrons on devices, at sea level and in avionics embedded systems;Leray;Microelectron Reliab,2007
3. Soft-error rate induced by thermal and low energy neutrons in 40nm SRAMs;Autran;IEEE Trans Nucl Sci,2012
4. Radiation-induced soft errors in advanced semiconductor technologies;Baumann;IEEE Trans Dev Mater Reliab,2005
5. Wen S, Wong R, Romain M, Tam N. Thermal neutron soft error rate for SRAM in the 90–45nm technology range. In: IEEE international reliability physics physics symposium; 2010, pp. 1036–39.
Cited by
27 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献