SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles
Author:
Funder
Ministerio de Ciencia e Innovación
Publisher
Elsevier BV
Subject
Artificial Intelligence,Computer Networks and Communications,Hardware and Architecture,Software
Reference31 articles.
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4. Analyzing the influence of the angles of incidence and rotation on MBU events induced by low LET heavy ions in a 28-nm SRAM-Based FPGA;Tonfat;IEEE Trans. Nuclear Sci.,2017
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