Heavy Ions Induced Single Event Upsets Testing of the 28 nm Xilinx Zynq-7000 All Programmable SoC-Reference-Cited by-同舟云学术

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Heavy Ions Induced Single Event Upsets Testing of the 28 nm Xilinx Zynq-7000 All Programmable SoC

Published:2015-07 Issue: Volume: Page:
ISSN:
Container-title:2015 IEEE Radiation Effects Data Workshop (REDW)
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Author:

Tambara Lucas Antunes,Kastensmidt Fernanda Lima,Medina Nilberto H.,Added Nemitala,Aguiar Vitor A. P.,Aguirre Fernando,Macchione Eduardo L. A.,Silveira Marcilei A. G.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7336694/7336695/07336716.pdf?arnumber=7336716

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4. Investigation of the Zynq-7000 Integrated XADC under Proton Irradiation;2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC);2023-07

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