Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Stability of thin film resistors – prediction and differences base on time-dependent Arrhenius law;Kuehl;Microelectron Reliab,2009
2. Kuehl RW. Using the Arrhenius equation to predict drift in thin film resistors. In: Proceedings CARTS-Europe 2010, 2010, 22nd annual passive components symposium, November 10–11, 2010, International Congress Center, Munich, Germany. pp. 121–133.
3. Standard of the Automotive Electronics Council. AEC-Q200 Rev D base: Stress test qualification for passive components. .
4. Standard of the International Electrotechnical Commission. IEC 60068-2 (2) TEST METHOD 78.
5. The accelerated testing of plastic encapsulated semiconductor component reliability;Lawson;Int Reliab Phys Symp,1974
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