Author:
Chen Wangyong,Cai Linlin,Wang Kunliang,Zhang Xing,Liu Xiaoyan,Du Gang
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. Self-heating in advanced CMOS technologies;Prasad,2017
2. Investigation of self-heating effects in gate-all-around MOSFETs with vertically stacked multiple silicon nanowire channels;Park;IEEE Trans. Electron Devices,2017
3. Hot carrier degradation in nanowire transistors: physical mechanisms, width dependence and impact of self-heating;Laurent,2016
4. Experimental validation of self-heating simulations and projections for transistors in deeply scaled nodes;Bury,2014
5. Self-heating-aware CMOS reliability characterization using degradation maps;Bury,2018
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献