Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits-Reference-Cited by-同舟云学术

Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits

Published:2019-09 Issue: Volume:100-101 Page:113341
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Goerl Roger,Villa Paulo,Vargas Fabian L.,Marcon César A.,Medina Nilberto H.,Added Nemitala,Guazzelli Marcilei A.

Funder

CNPq

National Science Foundation, Brazil

Coordenação de Aperfeiçoamento de Pessoal de Nivel Superior – Brasil

CAPES

Federal Institute of Rio Grande do Sul

IFRS

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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4. Heavy-ion radiation impact on a 4 Mb FRAM under different test modes and conditions;Gupta;IEEE Trans. Nucl. Sci.,2016

5. Analysis of SRAM-based FPGA SEU sensitivity to combined EMI and TID-imprinted effects;Benfica;IEEE Trans. Nucl. Sci.,2016

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4. Resiliency in Digital Processing Systems;2023 IEEE 33rd International Conference on Microelectronics (MIEL);2023-10-16

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