An overview of radiation effects on electronics in the space telecommunications environment-Reference-Cited by-同舟云学术

An overview of radiation effects on electronics in the space telecommunications environment

Published:2000-01 Issue:1 Volume:40 Page:17-26
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Fleetwood Daniel M.,Winokur Peter S.,Dodd Paul E.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference104 articles.

1. Hughes HL. Historical perspective. Ma TP, Dressendorfer PV, editors. Ionizing radiation effects in MOS devices and circuits. New York: Wiley, 1989, pp. 47–86 (and references therein)

2. Results of the telstar radiation experiments;Brown;Bell System Tech. J,1963

3. Results of the telstar space experiments;Hutchinson;Bell System Tech. J,1963

4. The command system malfunction of the telstar satellite;Mayo;Bell System Tech. J,1963

5. NSREC Archive of Radiation Effects Short Course Notebooks on CD-ROM, IEEE Product Order Code EC110, 1980–1998

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