Author:
Zimpeck A.L.,Meinhardt C.,Artola L.,Hubert G.,Kastensmidt F.L.,Reis R.A.L.
Funder
CNPq
CAPES
Research Support Foundation of the State of Rio Grande do Sul
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. Investigation on asymmetric dual-k spacer (ads) Trigate wavy FinFET: a novel device;Pradhan;IEEE Devices, Circuits and Systems (ICDCS),2016
2. FinFETs for nanoscale CMOS digital integrated circuits;King;IEEE/ACM ICCAD,2005
3. Robust system design to overcome CMOS reliability challenges;Mitra;IEEE J. Emerging Sel. Top. Circuits Syst.,2011
4. Grain-orientation induced work function variation in Nanoscale metal-gate transistors - part I - modeling, analysis and experimental validation;Dadgour;IEEE Trans. Electron Devices,2010
5. High-k organic, inorganic, and hybrid dielectrics for low-voltage organic field-effect transistors;Ortiz;Chem. Rev.,2010
Cited by
23 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Study of the Reliability for the Leakage Mitigation Methods using FinFETs;Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering);2023-11
2. Using Lyapunov Exponents and Entropy to Estimate Sensitivity to Process Variability;2023 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2023-06-20
3. Reliability Analysis of FinFET Based High Performance Circuits;Electronics;2023-03-15
4. Using Lyapunov Exponents to Estimate Sensitivity to Process Variability;2023 IEEE 14th Latin America Symposium on Circuits and Systems (LASCAS);2023-02-27
5. LCINDEP: a novel technique for leakage reduction in FinFET based circuits;Semiconductor Science and Technology;2022-11-29