Impact of radiation-induced soft error on embedded cryptography algorithms-Reference-Cited by-同舟云学术

Impact of radiation-induced soft error on embedded cryptography algorithms

Published:2021-11 Issue: Volume:126 Page:114349
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Bandeira Vitor,Sampford Jack,Garibotti Rafael,Trindade Matheus Garay,Bastos Rodrigo Possamai,Reis Ricardo,Ost Luciano

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. ASIC-oriented comparative review of hardware security algorithms for internet of things applications;Bahnasawi;ICM,2016

2. Benchmarking and optimizing AES for lightweight cryptography on ASICs;Yu;LCW,2019

3. An efficient AES implementation using FPGA with enhanced security features;Zodpe;JKSUES,2020

4. Optimization and implementation of AES algorithm based on FPGA;Zhang,2018

5. Error analysis and detection procedures for a hardware implementation of the advanced encryption standard;Bertoni;IEEE TC,2003

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Assessment of Lightweight Cryptography Algorithms on ARM Cortex-M Processors;2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2023-08-28

2. Assessment of Radiation-Induced Soft Errors on Lightweight Cryptography Algorithms Running on a Resource-Constrained Device;IEEE Transactions on Nuclear Science;2023-08

3. Assessment of Communication Protocols’ Latency in Co-processing Robotic Systems;2023 21st IEEE Interregional NEWCAS Conference (NEWCAS);2023-06-26

4. Security and Reliability Evaluation of Countermeasures implemented using High-Level Synthesis;2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS);2022-09-12

5. Early Soft Error Reliability Analysis on RISC-V;IEEE Latin America Transactions;2022-09