Early Soft Error Reliability Analysis on RISC-V-Reference-Cited by-同舟云学术

Early Soft Error Reliability Analysis on RISC-V

Published:2022-09 Issue:9 Volume:20 Page:2139-2145
ISSN:1548-0992
Container-title:IEEE Latin America Transactions
language:
Short-container-title:IEEE Latin Am. Trans.

Author:

Lodea Nicolas¹^ORCID,Nunes Willian¹^ORCID,Zanini Vitor¹^ORCID,Sartori Marcos¹^ORCID,Ost Luciano²^ORCID,Calazans Ney¹^ORCID,Garibotti Rafael¹^ORCID,Marcon Cesar¹^ORCID

Affiliation:

1. PUCRS University

2. Loughborough University

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/9907/9878165/09878169.pdf?arnumber=9878169

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4. RISC-V-Based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters;Lecture Notes in Computer Science;2023

5. Soft Error Assessment of CNN Inference Models Running on a RISC-V Processor;2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2022-10-24