Author:
Phoulady Adrian,Suleiman Yara,Choi Hongbin,Moore Toni,May Nicholas,Shahbazmohamadi Sina,Tavousi Pouya
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference29 articles.
1. Counterfeit integrated circuits: a rising threat in the global semiconductor supply chain;Guin;Proc. IEEE,2014
2. A novel crowdsourcing platform for microelectronics counterfeit defect detection;Ahmadi;Microelectron. Reliab.,2018
3. Advanced physical inspection methods for counterfeit IC detection;Shahbazmohamadi,2014
4. Accelerate your 3D X-ray failure analysis by deep learning high resolution reconstruction;Gu,2021
5. Deep neural networks-based rolling bearing fault diagnosis;Chen;Microelectron. Reliab.,2017
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