Author:
Hsu Shu-Han,Huang Ying-Yuan,Wu Yi-Da,Yang Kexin,Lin Li-Hsiang,Milor Linda
Funder
National Science Foundation
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits: Invited paper;Seok,2018
2. Register file circuits and post-deployment framework to monitor aging effects in field;Yang,2016
3. In-situ and in-field technique for monitoring and decelerating NBTI in 6T-SRAM register files;Yang;IEEE Transactions on Very Large Scale Integration (VLSI) Systems,2018
4. Online measurement of degradation due to bias temperature instability in SRAMs;Ahmed;IEEE Transactions on Very Large Scale Integration (VLSI) Systems,2016
5. Interplay of voltage and temperature acceleration of oxide breakdown for ultra-thin gate oxides;Wu;Solid State Electron.,2002
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Design and Analysis of a Radiation Resistant 12T SRAM Cell for Aerospace
Applications;Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering);2023-06