Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning-Reference-Cited by-同舟云学术

Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning

Published:2020-11 Issue: Volume:114 Page:113799
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Chen J.,Lange T.,Andjelkovic M.,Simevski A.,Krstic M.

Funder

European Union's Horizon 2020

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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4. Detection of solar particle events inside FPGAs;Glein,2016

5. PISA: power-robust microprocessor design for space applications;Simevski,2020

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