Author:
Malagón Daniel,Torrens Gabriel,Segura Jaume,Bota Sebastià A.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference39 articles.
1. Dependable multicore architectures at nanoscale: the view from Europe;Ottavi;IEEE Design Test,2015
2. Basic mechanisms and modeling of single-event upset in digital microelectronics;Dodd;IEEE Trans. Nucl. Sci.,2003
3. Factors that impact the critical charge of memory elements;Heijmen,2006
4. Analysis of radiation-hardening techniques for 6T SRAMs with structured layouts;Torrens,2009
5. Impact of technology scaling on SRAM soft error rates;Chatterjee;IEEE Trans. Nucl. Sci.,2014
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Application of 2D Walsh-Hadamard transform in SRAM upset bitmaps processing;Microelectronics Reliability;2024-06
2. Radiation Effects and Their Impact on SRAM Design;Advanced Ultra Low‐Power Semiconductor Devices;2023-10-27
3. Design and Analysis of a Radiation Resistant 12T SRAM Cell for Aerospace
Applications;Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering);2023-06