Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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1. Read Disturbance in High Bandwidth Memory: A Detailed Experimental Study on HBM2 DRAM Chips;2024 54th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN);2024-06-24
2. CoMeT: Count-Min-Sketch-based Row Tracking to Mitigate RowHammer at Low Cost;2024 IEEE International Symposium on High-Performance Computer Architecture (HPCA);2024-03-02
3. Spatial Variation-Aware Read Disturbance Defenses: Experimental Analysis of Real DRAM Chips and Implications on Future Solutions;2024 IEEE International Symposium on High-Performance Computer Architecture (HPCA);2024-03-02
4. RowPress: Amplifying Read Disturbance in Modern DRAM Chips;Proceedings of the 50th Annual International Symposium on Computer Architecture;2023-06-17
5. An Experimental Analysis of RowHammer in HBM2 DRAM Chips;2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S);2023-06