On the retention time distribution of dynamic random access memory (DRAM)-Reference-Cited by-同舟云学术

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On the retention time distribution of dynamic random access memory (DRAM)

Published:1998-06 Issue:6 Volume:45 Page:1300-1309
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Hamamoto T.,Sugiura S.,Sawada S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx4/16/14932/00678551.pdf?arnumber=678551

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