Electrical characterization and analysis techniques for the high-κ era-Reference-Cited by-同舟云学术

Electrical characterization and analysis techniques for the high-κ era

Published:2007-04 Issue:4-5 Volume:47 Page:479-488
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Young Chadwin D.,Heh Dawei,Neugroschel Arnost,Choi Rino,Lee Byoung Hun,Bersuker Gennadi

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference75 articles.

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5. Validity of constant voltage stress based reliability assessment of high-κ devices;Lee;IEEE Trans Dev Mater Reliab,2005

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