Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference37 articles.
1. Advanced high-k dielectric stacks with polySi and metal gates: recent progress and current challenges;Gusev;IBM J. Res. Dev.,2006
2. Long-range Coulomb interactions in small Si devices. Part I: performance and reliability;Fischetti;J. Appl. Phys.,2001
3. Fundamental and Technological Aspects of High-k Gate Dielectrics;Houssa,2004
4. Transconductance enhancement in deep submicron strained-Si n-MOSFETs;Rim,1998
5. Multiple-gate SOI MOSFETs: device design guidelines;Park;IEEE Trans. Electron Devices,2002
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3 articles.
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