Natural radiation events in CCD imagers at ground level-Reference-Cited by-同舟云学术

Natural radiation events in CCD imagers at ground level

Published:2016-09 Issue: Volume:64 Page:68-72
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Saad Saoud T.,Moindjie S.,Munteanu D.,Autran J.L.^ORCID

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference38 articles.

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