Author:
Chenet Cristiano P.,Tambara Lucas A.,de Borges Gabriel M.,Kastensmidt Fernanda,Lubaszewski Marcelo S.,Balen Tiago R.
Funder
Fundação de Amparo à Pesquisa do Estado do Rio Grande do Sul (FAPERGS)
Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference35 articles.
1. Reliable Computer Systems: Design and Evaluation;Siewiorek,1998
2. On modeling faults in FinFET logic circuits;Liu,2012
3. New Insights about Oxide Breakdown Occurrence at Circuit Level;Saliva,2014
4. Reliability Performance of Different Layouts of Wide Metal Tracks;Kludt,2014
5. New hot-carrier injection and device degradation in submicron MOSFETs;Takeda;Solid-State Electron Devices IEE Proc. I,1983
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