1. (2011) IEEE standard for terminology and test methods for analog-to-digital converters. IEEE Std 1241-2010 (Revision of IEEE Std 1241-2000) pp 1-139
2. Actel (2012) Corp. Smartfusion PSoC Handbook: Datasheet
3. Balen TR, Vaz RG, Fernandes GS, Goncalez OL (2016) Influence of alternate biasing on TID effects of irradiated mixed-signal programmable arrays. IEEE Trans Nucl Sci 63(4):2390–2398
4. Becker TE, Lanot AJ, Cardoso GS, Balen TR (2017) Single event transient effects on charge redistribution SAR ADCs. Microelectron Reliab 73:22–35
5. Bee S, Hopkinson G, Harboe-Sorensen R, Adams L, Smith A (1998) Heavy-ion study of single event effects in 12- and 16-bit ADCs. In: Proc. IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385), IEEE