Single event transient effects on charge redistribution SAR ADCs-Reference-Cited by-同舟云学术

Single event transient effects on charge redistribution SAR ADCs

Published:2017-06 Issue: Volume:73 Page:22-35
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Becker Thales E.,Lanot Alisson J.C.,Cardoso Guilherme S.,Balen Tiago R.^ORCID

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference49 articles.

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5. MSP430F663x Mixed Signal Microcontroller;Inc,2012

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1. Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs;Journal of Electronic Testing;2021-06

2. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy;IEEE Transactions on Nuclear Science;2020-03

3. Influence of sampling frequency on TID response of SAR ADCs;2020 IEEE Latin-American Test Symposium (LATS);2020-03

4. A BICS-based strategy for mitigating the effects of single event transients on SAR converter;Microelectronics Reliability;2019-02

5. A novel single-event-hardened charge pump using cascode voltage switch logic gates;Microelectronics Reliability;2018-12