Coupling simulation and accelerated degradation model for reliability estimation: Application to a voltage regulator-Reference-Cited by-同舟云学术

Coupling simulation and accelerated degradation model for reliability estimation: Application to a voltage regulator

Published:2022-11 Issue: Volume:138 Page:114682
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Al Rashid Jaber,Saintis Laurent,Koohestani Mohsen,Barreau Mihaela

Funder

Conseil Régional des Pays de la Loire

Universite Angers

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. A new methodology for EMC prediction of integrated circuits after ageing;Ghfiri;IEEE Trans. Electromagn. Compat.,2019

2. Reliability Prediction of Electronic Equipment;MIL-HDBK-217F,1991

3. Reliability Methodology for Electronic Systems, DGA- DM/STTC/CO/477-A;Guide FIDES,2004

4. A thorough investigation of MOSFET’s NBTI degradation;Huard;Microelectron. Reliab.,2005

5. Experimental investigations into the effects of electrical stress on electromagnetic emission from integrated circuits;Barbel;IEEE Trans. Electromagn. Compat.,2013

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