Author:
Jiang Yong,Lai Li-Lung,Zhou Jian-Jun
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference48 articles.
1. Analysis and design of digital integrated circuits;Hodges,2003
2. Digital integrated circuits: a design perspective;Rabaey,2003
3. CMOS: circuit design, layout, and simulation;Baker,2010
4. Soden JM, Anderson RE. IC failure analysis - techniques and tools for quality and reliability improvement. in: Proceedings of the IEEE 1993; 81: 703.
5. IC failure analysis – techniques and tools for quality and reliability improvement;Soden;Microelectron Reliab,1995
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献