Nanoscale surface conductivity analysis of plasma sputtered carbon thin films
Author:
Affiliation:
1. Center for Advanced Plasma Surface Technology (CAPST)
2. NU-SKKU Joint Institute for Plasma Nano-Materials (IPNM)
3. Advanced Materials Science and Engineering
4. Sungkyunkwan University
5. Suwon
Abstract
The present work demonstrates the phenomenon of nanoscale surface conductivity variation in various plasma conditions of sputtering induced carbon thin films.
Funder
National Research Foundation of Korea
Publisher
Royal Society of Chemistry (RSC)
Subject
General Chemical Engineering,General Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2015/RA/C5RA17068K
Reference28 articles.
1. Hybrid graphene/amorphous carbon films with tadpole-like structures for high-performance photovoltaic applications
2. Electrodeposition of diamond-like carbon films on titanium alloy using organic liquids: Corrosion and wear resistance
3. Thermal conductivity of nanocrystalline carbon films studied by pulsed photothermal reflectance
4. Growth and Electrochemical Characterization of Carbon Nanospike Thin Film Electrodes
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