Author:
Soden Jerry M.,Anderson Richard E.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference94 articles.
1. Failure Analysis: From ‘Postmortem’ to ‘Preventive’;Burggraaf;Semiconductor Int.,1992
2. Testing Errors: Data and Calculations in an IC Manufacturing Process;Williams,1992
3. Quiescent Power Supply Current Measurement for CMOS IC Defect Detection;Hawkins;IEEE Trans. on Indus. Electron.,1989
4. Locating High Resistance Shorts in CMOS Circuits by Analyzing Supply Current Measurement Vectors;Burns,1989
5. The Top Six IC Failure Mechanisms,1992
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