Author:
Iwanowicz Marcin,Jasiński Jakub,Głuszko Grzegorz,Łukasiak Lidia,Jakubowski Andrzej,Gottlob Heinrich,Schmidt Mathias
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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1. Double gate dielectric stacks with Gd2O3 layer for application in NVSM devices;Microelectronic Engineering;2014-03
2. Optimization of gadolinium oxide growth deposited on Si by high pressure sputtering;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2013-01