Investigation methods and approaches for alleviating charge trapping phenomena in ohmic RF-MEMS switches submitted to cycling test-Reference-Cited by-同舟云学术

Investigation methods and approaches for alleviating charge trapping phenomena in ohmic RF-MEMS switches submitted to cycling test

Published:2011-09 Issue:9-11 Volume:51 Page:1887-1891
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Massenz A.,Barbato M.,Giliberto V.,Margesin B.,Colpo S.,Meneghesso G.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Three dimensional RF MEMS switch for power applications;Joo Young;Trans Ind Electron IEEE,2009

2. A zipper RF MEMS tunable capacitor with interdigitated RF and actuation electrodes;Mahameed;J Micromech Microeng,2010

3. Mixed-domain fast simulation of RF and microwave mems-based complex networks within standard IC development frameworks;Iannacci,2010

4. RF MEMS and their applications;Varadan,2003

5. Radant MEMS. .

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