Author:
Pietranico S.,Lefebvre S.,Pommier S.,Berkani Bouaroudj M.,Bontemps S.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
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5. Characterization of ageing failures on power MOSFET devices by electron and ion microscopies;Martineau;Microelectron Reliab,2009
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