The effects of active layer thickness and annealing conditions on the electrical performance of ZnON thin-film transistors-Reference-Cited by-同舟云学术

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The effects of active layer thickness and annealing conditions on the electrical performance of ZnON thin-film transistors

Published:2016-12 Issue: Volume:688 Page:666-671
ISSN:0925-8388
Container-title:Journal of Alloys and Compounds
language:en
Short-container-title:Journal of Alloys and Compounds

Author:

Park Jozeph,Kim Yang Soo,Kim Jong Heon,Park Kyung,Park Yun Chang,Kim Hyun-Suk

Funder

Basic Science Research Program

National Research Foundation of Korea (NRF)

Ministry of Education

MOTIE (Ministry of Trade, Industry & Energy

KDRC (Korea Display Research Corporation)

Chungnam National University

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Reference24 articles.

1. Ionic amorphous oxide semiconductors: material design, carrier transport, and device application;Hosono;J. Non-Crys. Solids,2006

2. The physics of amorphous-silicon thin-film transistors;Powell;IEEE Trans. Electron. Dev.,1989

3. Hydrogenated Amorphous Silicon;Street,2005

4. Review of recent developments in amorphous oxide semiconductor thin-film transistor devices;Park;Thin Solid Film.,2012

5. Overview of electroceramic materials for oxide semiconductor thin film transistors;Park;J. Electroceram.,2014

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1. Research progress of high mobility metal oxide semiconductor thin film transistors;CHIN J LIQ CRYST DIS;2024

2. N‐Doped ZnSnO Optoelectronic Synaptic Thin Film Transistors with Enhanced Visible‐Light Response;physica status solidi (RRL) – Rapid Research Letters;2024-02-02

3. Electrical performance of La-doped In₂O₃ thin-film transistors prepared using a solution method for low-voltage driving;RSC Advances;2024

4. Surface Chemical Reactions During Atomic Layer Deposition of Zinc Oxynitride (ZnON);Electronic Materials Letters;2023-11-10

5. Amorphous oxide semiconductors: From fundamental properties to practical applications;Current Opinion in Solid State and Materials Science;2023-08

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