The influence of radiation damage (microscopic causes) on the sensitivity of Auger electron spectroscopy and X-ray photoelectron spectroscopy
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Published:1985-02
Issue:4
Volume:20
Page:457-471
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ISSN:0378-5963
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Container-title:Applications of Surface Science
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language:en
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Short-container-title:Applications of Surface Science
Subject
General Engineering
Cited by
43 articles.
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