Beam effects in AES revealed by XPS
Author:
Publisher
Royal Society of Chemistry (RSC)
Link
http://pubs.rsc.org/en/content/articlepdf/1975/DC/DC9756000269
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1. American society for testing and materials. Standard guide for minimizing unwanted electron beam effects in Auger electron spectroscopy (E983-89);Surface and Interface Analysis;1991-11
2. Electron beam induced reduction of CuO in the presence of a surface carbonaceous layer: an XPS/HREELS study;Surface Science;1989-04
3. Electron stimulated desorption of oxygen from, and subsequent type conversion of, thin‐film p‐CuInSe2;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1989-03
4. American Society for Testing and Materials standard guide for electron beam effects in Auger electron spectroscopy (E983-84);Surface and Interface Analysis;1987-03
5. The influence of radiation damage (microscopic causes) on the sensitivity of Auger electron spectroscopy and X-ray photoelectron spectroscopy;Applications of Surface Science;1985-02
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