Author:
Akiyama Terunobu,Tonin Andreas,Hidber Hans-Rudolf,Brugger Jürgen,Vettiger Peter,Staufer Urs,de Rooij Nico. F.
Subject
Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. Atomic resolution with an atomic force microscope using piezoresistive detection;Tortonese;Appl. Phys. Lett.,1993
2. Atomic force microscopy and lateral force microscopy using piezoresistive cantilevers;Linnemann;J. Vac. Sci. Technol. B,1996
3. Application of lead zirconate titanate thin film displacement sensors for the atomic force microscope;Fujii;J. Vac. Sci. B,1995
4. Atomic force microscopy using cantilevers with integrated tips and piezoelectric layer for actuation and detection;Indermühle,1996
5. Independent parallel scanning force microscopy using Pb(Zr,Ti)O3 microcantilever array;Itoh,1997
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