Micromachining of diamond probes for atomic force microscopy applications

Author:

Unno Kazuya,Shibata Takayuki,Makino Eiji

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Cited by 23 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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4. General Resolution Enhancement Method in Atomic Force Microscopy Using Deep Learning;Advanced Theory and Simulations;2018-11-09

5. 3.2 Atomic Force Microscopy ☆;Comprehensive Biomaterials II;2017

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