General Resolution Enhancement Method in Atomic Force Microscopy Using Deep Learning-Reference-Cited by-同舟云学术

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General Resolution Enhancement Method in Atomic Force Microscopy Using Deep Learning

Published:2018-11-09 Issue:2 Volume:2 Page:1800137
ISSN:2513-0390
Container-title:Advanced Theory and Simulations
language:en
Short-container-title:Adv. Theory Simul.

Author:

Liu Yue¹,Sun Qiaomei¹,Lu Wanheng¹,Wang Hongli¹,Sun Yao¹,Wang Zhongting¹,Lu Xin¹,Zeng Kaiyang¹^ORCID

Affiliation:

1. Department of Mechanical EngineeringNational University of Singapore 9 Engineering Drive 1 Singapore 117576

Funder

Ministry of Education - Singapore

National University of Singapore

Publisher

Wiley

Subject

Multidisciplinary,Modelling and Simulation,Numerical Analysis,Statistics and Probability

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adts.201800137

Reference36 articles.

1. Scratching the Surface: Fundamental Investigations of Tribology with Atomic Force Microscopy

2. Advances in atomic force microscopy

3. Dynamic atomic force microscopy methods

4. "Dip-Pen" Nanolithography

5. True atomic resolution imaging of surface structure and surface charge on the GaAs(110)

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