Author:
Coskun M. Bulut,Soleymaniha Mohammadreza,Mahdavi Mohammad,Moheimani S.O. Reza
Reference77 articles.
1. Harnessing the damping properties of materials for high-speed atomic force microscopy;Adams;Nature Nanotechnology,2016
2. Large area fast-AFM scanning with active “Quattro” cantilever arrays;Ahmad;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,2016
3. Integrated atomic force microscopy array probe with metal–oxide–semiconductor field effect transistor stress sensor, thermal bimorph actuator, and on-chip complementary metal–oxide–semiconductor electronics;Akiyama;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,2000
4. Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy;Akiyama;Review of Scientific Instruments,2010
5. A high bandwidth microelectromechanical system-based nanopositioner for scanning tunneling microscopy;Alipour;Review of Scientific Instruments,2019