Author:
Maurice J.-L.,Schwander P.,Baumann F.H.,Ourmazd A.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
17 articles.
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1. Interfaces;Materials Science and Technology;2013-02-15
2. Heterostructure interface roughness characterization by chemical mapping: Application to InGaP/GaAs quantum wells;Journal of Applied Physics;2008
3. Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction;The European Physical Journal Applied Physics;2003-10-03
4. Strain State Analysis;Transmission Electron Microscopy of Semiconductor Nanostructures: Analysis of Composition and Strain State;2003
5. Introduction;Transmission Electron Microscopy of Semiconductor Nanostructures: Analysis of Composition and Strain State;2003