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High resolution composition profiles of multilayers

Published:1995-07-16 Issue:1 Volume:150 Page:31-50
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Baumann F. H.,Gribelyuk M.,Kim Y.,Kisielowski C.,Maurice J-L.,Rau W.-D.,Rentschler J. A.,Schwander P.,Ourmazd A.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. Materials analysis with a position-sensitive atom probe

2. Atomic structure and luminescence excitation of GaAs/(AlAs)n(GaAs)mquantum wires with the scanning tunneling microscope

3. Interface segregation and clustering in strained-layer InGaAs/GaAs heterostructures studied by cross-sectional scanning tunneling microscopy

4. Interface roughness and asymmetry in InAs/GaSb superlattices studied by scanning tunneling microscopy

5. Quantitative chemical lattice imaging: theory and practice

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Interfaces;Materials Science and Technology;2013-02-15

2. Chapter 4 Defect Processes in Semiconductors Studied at the Atomic Level by Transmission Electron Microscopy;Semiconductors and Semimetals;1999

3. Accurate structure determination from image reconstruction in ADF STEM;Journal of Microscopy;1998-04

4. Real-space analysis of lattice images and its link to conventional theory;Ultramicroscopy;1997-07

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