Composition determination from HREM images of substitutional alloys
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. Minimum detectable solute concentration in atomic-resolution transmission electron microscopy
2. High-resolution structure imaging of partially disordered atomic columns in binary alloy systems
3. High Contrast TEM Observation of Lattice Image of GaAs-Al0.28Ga0.72As Superlattice with [100] Electron Beam Incidence
4. Determination of the atomic configuration at semiconductor interfaces
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3. ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY;Annual Review of Materials Research;2005-08-04
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5. HREM Image Analysis of III-V Heterostructures Based on Neural Networks;physica status solidi (b);2000-11
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