Noise characteristics analysis of short wave infrared InGaAs focal plane arrays-Reference-Cited by-同舟云学术

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Noise characteristics analysis of short wave infrared InGaAs focal plane arrays

Published:2017-09 Issue: Volume:85 Page:74-80
ISSN:1350-4495
Container-title:Infrared Physics & Technology
language:en
Short-container-title:Infrared Physics & Technology

Author:

Yu Chunlei,Li Xue,Yang Bo,Huang Songlei,Shao Xiumei,Zhang Yaguang,Gong Haimei

Funder

Shanghai Institute of Micro-system and Information Technology

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. The development of InGaAs short wavelength infrared focal plane arrays with high performance;Li;Infrared Phys. Technol.,2017

2. Extracting dark current components and characteristics parameters for InGaAs/InP avalanche photodiodes;Jiao;Infrared Phys. Technol.,2016

3. Extended wavelength SWIR InGaAs focal plane array: characteristics and limitations;Arslan;Infrared Phys. Technol.,2015

4. Dark current simulation of InP/In0.53Ga0.47As/InP p-i-n photodiode;Wang;Opt. Quant. Electron.,2008

5. Short-wavelength infrared imaging using low dark current InGaAs detector arrays and vertical-cavity surface-emitting laser illuminators;MacDougal;Opt. Eng.,2011

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