Research on factors affecting wear uniformity of the wheels in the double-sided lapping

Author:

Lai Zhiyuan,Hu ZhongweiORCID,Fang Congfu,Yu Yiqing,xiao Zunhe,Hsieh Pinhui,Chen Mingxin

Funder

National Natural Science Foundation of China

Science and Technology Projects of Xiamen

Fujian Province Regional Development Project in 2019

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management

Reference27 articles.

1. Macroscopic and microscopic investigation on chemical mechanical polishing of sapphire wafer;Lee;J Nanosci Nanotechno,2012

2. Ultraprecision CMP for sapphire, GaN, and SiC for advanced optoelectronics materials;Hideo;Curr Appl Phys,2012

3. Simultaneous double side grinding of silicon wafers: a literature review;Li;Int J Mach Tools Manuf.,2006

4. Fine grinding of silicon wafers;Pei;Int J Mach Tools Manuf.,2001

5. Evaluation of double sided lapping using a fixed abrasive pad for sapphire substrates;Kim;Wear,2013

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