Scanning thermal microscopy—a tool for thermal measurement in the nanoscale-Reference-Cited by-同舟云学术

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Scanning thermal microscopy—a tool for thermal measurement in the nanoscale

Published:2019 Issue: Volume: Page:181-213
ISSN:1876-2778
Container-title:Frontiers of Nanoscience
language:
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Author:

Bodzenta Jerzy

Publisher

Elsevier

Reference127 articles.

1. The World's Most Advanced Data Center GPU;Durant,2017

2. Intel Now Packs 100 Million Transistors in Each Square Millimeter;Courtland,2017

3. Intel Product Specifications, Processors, Intel Xeon Phi 72x5 Processor Family,2018

4. Thermal microscopy of electronic materials;Heiderhoff;Mater. Sci. Semicond. Process.,2016

5. Thermal barrier coating materials;Clarke;Mater. Today,2005

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Light-Induced Thermal and Optical Behavior of Functionalized Side-Chain Push–Pull Azo Polymer Thin Films;The Journal of Physical Chemistry C;2023-07-07

2. Realizing the Accurate Measurements of Thermal Conductivity over a Wide Range by Scanning Thermal Microscopy Combined with Quantitative Prediction of Thermal Contact Resistance;Small;2023-04-17

3. Thermal characterization of morphologically diverse copper phthalocyanine thin layers by scanning thermal microscopy;Ultramicroscopy;2022-03

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