Analysis and understanding of unique cryogenic phenomena in state-of-the-art SiGe HBTs

Author:

Liang Qingqing,Krithivasan Ramkumar,Ahmed Adnan,Lu Yuan,Li Ying,Cressler John D.,Niu Guofu,Rieh Jae-Sung,Freeman Greg,Ahlgren Dave,Joseph Alvin

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference25 articles.

1. Silicon heterostructure handbook: materials, fabrication, devices, circuits, and applications of SiGe and Si strained-layer epitaxy;Cressler,2006

2. Rieh J-S, Jagannathan B, Chen H, Schonenberg KT, Angell D, Chinthakindi A, et al. SiGe HBTs with cut-off frequency of 350GHz. In: Int electron. devices meeting 2002, Symp-2002. p. 771.

3. Greenberg DR, Sweeney S, Jagannathan B, Freeman G, Ahlgren D. Noise performance scaling in high-speed silicon RF technologies. In: Silicon monolithic integrated circuits in RF systems 2003, Symp-2003. p. 22.

4. Silicon–germanium heterojunction bipolar transistors;Cressler,2003

5. A physics-based high-injection transit-time model applied to barrier effects in SiGe HBTs;Liang;IEEE Trans Electron Dev,2002

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