Hydrogen-induced program threshold voltage degradation analysis in SONOS wafer

Author:

Lin QingORCID,Zhao Crystal,Sheng Nan

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Cypress SONOS technology;Ramkumar;Cypress Semiconduct,2013

2. Ramkumar, Krishnaswamy, Bo, Jin. Advantages of SONOS memory for embedded flash technology. EETimes-Asia, Copyright © 2011 eMedia Asia Ltd.

3. Overview of emerging nonvolatile memory technologies;Meena;Nanoscale Res Lett,2014

4. On the go with SONOS;White;IEEE Circ Dev Mag,2000

5. Electrical characterization of metal-oxide-high-k dielectric-oxide-semiconductor (MOHOS) structures for memory applications;Hsu;Microelectron Reliab,2007

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