On the go with SONOS-Reference-Cited by-同舟云学术

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On the go with SONOS

Published:2000-07 Issue:4 Volume:16 Page:22-31
ISSN:8755-3996
Container-title:IEEE Circuits and Devices Magazine
language:
Short-container-title:IEEE Circuits Devices Mag.

Author:

White M.H.,Adams D.A.,Bu J.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/101/18633/00857747.pdf?arnumber=857747

Cited by 336 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improvement of memory performance of 3-D NAND flash memory with retrograde channel doping;Memories - Materials, Devices, Circuits and Systems;2023-07

2. Thermal Stability of Ferroelectric Films Based on Hafnium–Zirconium Dioxide on Silicon;Bulletin of the Russian Academy of Sciences: Physics;2023-06

3. Thermal stability of ferroelectric films based on hafnium-zirconium dioxide on silicon;Известия Российской академии наук. Серия физическая;2023-06-01

4. Effect of Hydrogen Plasma Treatment on Atomic Layer Deposited Silicon Nitride Film;ECS Journal of Solid State Science and Technology;2022-06-01

5. Table of Contents;IEEE Microwave Magazine;2022-03

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