Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature;Theodorou;Solid-State Electron,2016
2. Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise;Kirton;Adv Phys,1989
3. Distinction between silicon and oxide traps using single-trap spectroscopy: Distinction between silicon and oxide traps;Fang;“Distinction between silicon and oxide traps using single-trap spectroscopy”, physica status solidi (a),2015
4. A. Tataridou, G. Ghibaudo, and C. Theodorou, “VERILOR: A Verilog-A Model of Lorentzian Spectra for Simulating Trap-related Noise in CMOS Circuits,” in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC), Sep. 2021, pp. 247–250. doi: 10.1109/ESSDERC53440.2021.9631802.
5. Random telegraph signal noise SPICE modeling for circuit simulators;Leyris,2007
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