Using yield to predict long-term reliability of integrated circuits: Application of Boltzmann-Arrhenius-Zhurkov model-Reference-Cited by-同舟云学术

Using yield to predict long-term reliability of integrated circuits: Application of Boltzmann-Arrhenius-Zhurkov model

Published:2020-02 Issue: Volume:164 Page:107746
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Suhir E.,Stamenkovic Z.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Zhurkov SN, “Пpoблeмa пpoчнocти твëpдыx тeл” (The Problem of the Strength of Solids), Vestnik Akad. Nauk SSSR (Bulletin of the USSR Academy of Sciences), 11, 1957, pp. 78–82 (in Russian).

2. Kinetic concept of the strength of solids;Zhurkov;Int J Fract Mechanics,1965

3. Über die dissociationswärme und den einfluß der temperatur auf den dissociationsgrad der elektrolyte;Arrhenius;Z Phys Chem,1889

4. Studien über das Gleichgewicht der lebendigen kraft zwischen bewegten materiellen punkten;Boltzmann;Wiener Berichte,1868

5. Probabilistic design for reliability;Suhir;Chip Scale Rev,2010

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