A tale of three failure-oriented-accelerated-test (FOAT) types and their roles in assuring aerospace electronics-and-photonics reliability: Perspective-Reference-Cited by-同舟云学术

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A tale of three failure-oriented-accelerated-test (FOAT) types and their roles in assuring aerospace electronics-and-photonics reliability: Perspective

Published:2024-06 Issue:2 Volume:11 Page:322-325
ISSN:2468-8967
Container-title:Journal of Space Safety Engineering
language:en
Short-container-title:Journal of Space Safety Engineering

Author:

Suhir E.^ORCID

Publisher

Elsevier BV

Reference64 articles.

1. Microelectronics and photonics – the future;Suhir;Microelectron. J.,2000

2. C.-P. Wong, K.-S. Moon and Y. Li, eds., Nano-Bio-Electronics, Photonics and MEMS Packaging, Springer, 2010

3. Reliability and Accelerated Life Testing;Suhir,2005

4. Making a Viable Electron Device into a Reliable Product: brief Review;Suhir;J. Electron. Commun.,2020

5. How to make a device into a product: accelerated life testing, its role, attributes, challenges, pitfalls, and interaction with qualification testing;Suhir,2008

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Probabilistic design for reliability of aerospace electronics and photonics: role, significance, attributes, challenges;Metascience in Aerospace;2024

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