Measuring the specific contact resistance of contacts to semiconductor nanowires-Reference-Cited by-同舟云学术

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Measuring the specific contact resistance of contacts to semiconductor nanowires

Published:2005-02 Issue:2 Volume:49 Page:227-232
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Mohney S.E.,Wang Y.,Cabassi M.A.,Lew K.K.,Dey S.,Redwing J.M.,Mayer T.S.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. The incredible shrinking circuit;Lieber;Sci. Am.,2001

2. Nanowire nanosensors for highly sensitive and selective detection of biological and chemical species;Cui;Science,2001

3. High performance silicon nanowire field effect transistors;Cui;Nanoletters,2003

4. Logic gates and computation from assembled nanowire building blocks;Huang;Science,2001

5. Current crowding on metal contacts to planar devices;Murrmann;IEEE Trans. Electron Dev.,1969

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