Breaking the theoretical limit of SiC unipolar power device – A simulation study

Author:

Yu L.C.,Sheng K.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Tanaka Yasunori, Yano Koji, Okamoto Mitsuo, Takatsuka Akio, Fukuda Kenji, Kasuga Masanobu, et al. Fabrication of 700V SiC-SIT with ultra-low on-resistance of 1.01mΩ-cm2, ICSCRM 2005, Pittsburgh, USA.

2. Zhao JH, Tone K, Li X, Alexandrov P, Fursin L, Weiner M. 3.6mΩ-cm2, 1726V 4H–SiC normally-off trenched-and-implanted vertical JFETs, ISPSD 2003, Cambridge, UK. p. 50–3.

3. Demonstration of first 9.2kV 4H–SiC bipolar junction transistor;Zhang;IEE Electron Lett,2004

4. A new generation of high voltage MOSFETs breaks the limit line of silicon;Deboy;Proc IEDM,1998

5. Ng R et al. Lateral unbalanced super junction (USJ)/3D-RESURF for high breakdown voltage on SOI, ISPSD’01; 2001. p. 395.

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